GROUP-DELAY MEASUREMENT USING THE FOURIER-TRANSFORM OF AN INTERFEROMETRIC CROSS-CORRELATION GENERATED BY WHITE-LIGHT

被引：141
|
作者：
NAGANUMA, K
MOGI, K
YAMADA, H
机构：
[1] NTT Opto-electronics Laboratories, Atsugi-shi, Kanagawa, 243-01
来源：
OPTICS LETTERS | 1990年 / 15卷 / 07期
关键词：
D O I：
10.1364/OL.15.000393
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new method and apparatus for measuring the group delay in optical components and laser cavities are described. Cross-correlational fringes are fully recorded with a Michelson interferometer, in one of whose arms the optics to be measured are inserted. The path difference of the interferometer is calibrated to subwavelength accuracy, and the group delay is calculated from the phase of the Fourier transform of the measured fringe. The group delay for the entire visible-wavelength region is evaluated after a single measurement in approximately 10 min, using white light. © 1990 Optical Society of America.
引用
收藏
页码：393 / 395
页数：3
相关论文
共 50 条
  • [21] THE MM-WAVE DIELECTRIC MEASUREMENTS WITH AN ELECTRIC-FIELD CROSS-CORRELATION FOURIER-TRANSFORM SPECTROMETER
    DING, HY
    ZHANG, GZ
    INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 1993, 14 (08): : 1657 - 1666
  • [22] Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry
    Ma, S.
    Quan, C.
    Zhu, R.
    Tay, C. J.
    Chen, L.
    Gao, Z.
    OPTICS COMMUNICATIONS, 2011, 284 (10-11) : 2488 - 2493
  • [23] Time delay estimation of random signals using cross-correlation with Hilbert Transform
    Hanus, Robert
    MEASUREMENT, 2019, 146 : 792 - 799
  • [24] Micro-profile measurement of a transparent coating using windowed Fourier transform in white-light vertical scanning interferometry
    Ma, Suodong
    Quan, Chenggen
    Zhu, Rihong
    Chen, Lei
    6TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, 2012, 8417
  • [25] White Light Scanning Interferometry Based on Generalized Cross-Correlation Time Delay Estimation
    Zhou, Yunfei
    Zhong, Liyun
    Cai, Hongzhi
    Tian, Jindong
    Li, Dong
    Lu, Xiaoxu
    IEEE PHOTONICS JOURNAL, 2017, 9 (05):
  • [26] AUTOMATIC-MEASUREMENT OF IRREGULARITIES IN FREQUENCY-RESPONSE AND GROUP TIME-DELAY USING THE DISCRETE FOURIER-TRANSFORM
    BYCHKOV, SO
    LAVRENTYEV, AI
    TELECOMMUNICATIONS AND RADIO ENGINEERING, 1985, 39-4 (09) : 143 - 145
  • [27] CROSS-CORRELATION SIGNAL NOISE ENHANCEMENT WITH APPLICATIONS TO QUANTITATIVE GAS-CHROMATOGRAPHY FOURIER-TRANSFORM INFRARED SPECTROMETRY
    LAM, RB
    SPARKS, DT
    ISENHOUR, TL
    ANALYTICAL CHEMISTRY, 1982, 54 (12) : 1927 - 1931
  • [28] White-light digital image cross-correlation (DICC) analysis of the deformation of composite materials with random microstructure
    Rae, PJ
    Palmer, S
    Goldrein, HT
    Lewis, AL
    Field, JE
    OPTICS AND LASERS IN ENGINEERING, 2004, 41 (04) : 635 - 648
  • [29] Characterization of white-light continuum generation in transparent solid media using cross-correlation frequency resolved optical gating (XFROG)
    Imran, T.
    Figueira, G.
    INTERNATIONAL CONFERENCE ON APPLICATIONS OF OPTICS AND PHOTONICS, 2011, 8001
  • [30] MEASUREMENT OF TIME-DELAY USING THE TIME SHIFT PROPERTY OF THE DISCRETE FOURIER-TRANSFORM (DFT)
    NAGAI, K
    IEEE TRANSACTIONS ON ACOUSTICS SPEECH AND SIGNAL PROCESSING, 1986, 34 (04): : 1006 - 1008
12345