CRACK-LIKE SOURCES OF DISLOCATION NUCLEATION AND MULTIPLICATION IN THIN-FILMS

被引：63

作者：

JESSON, DE ^{[1
]}

CHEN, KM ^{[1
]}

PENNYCOOK, SJ ^{[1
]}

THUNDAT, T ^{[1
]}

WARMACK, RJ ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB, DIV HLTH SCI RES, OAK RIDGE, TN 37831 USA

来源：

SCIENCE | 1995年 / 268卷 / 5214期

关键词：

D O I：

10.1126/science.268.5214.1161

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

With the combination of the height sensitivity of atomic force microscopy and the strain sensitivity of transmission electron microscopy, it is shown that near singular stress concentrations can develop naturally in strained epitaxial films. These crack-like instabilities are identified as the sources of dislocation nucleation and multiplication in films of high misfit. This link between morphological instability and dislocation nucleation provides a method for studying the basic micromechanisms that determine the strength and mechanical properties of materials.

引用

页码：1161 / 1163

页数：3

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