EXAMINATION OF THE AL/AL2O3 INTERFACE BY HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：6
|
作者：
TIMSIT, RS [1 ]
WADDINGTON, WG [1 ]
HUMPHREYS, CJ [1 ]
HUTCHISON, JL [1 ]
机构：
[1] UNIV OXFORD,DEPT MET & SCI MAT,OXFORD OX1 3PH,ENGLAND
来源：
ULTRAMICROSCOPY | 1985年 / 18卷 / 1-4期
关键词：
D O I：
10.1016/0304-3991(85)90157-3
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：387 / 394
页数：8
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