MEASUREMENT OF INFRARED EMISSION SPECTRA USING MULTIPLE-SCAN INTERFEROMETRY

被引：51
|
作者：
LOW, MJD
COLEMAN, I
机构：
来源：
SPECTROCHIMICA ACTA | 1966年 / 22卷 / 03期
关键词：
D O I：
10.1016/0371-1951(66)80065-6
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：369 / &
相关论文
共 50 条
  • [31] STEP SCAN INTERFEROMETRY IN THE MID-INFRARED WITH PHOTOTHERMAL DETECTION
    SMITH, MJ
    MANNING, CJ
    PALMER, RA
    CHAO, JL
    APPLIED SPECTROSCOPY, 1988, 42 (04) : 546 - 555
  • [32] INFRARED EMISSION SPECTRA WITH SISAM .3. SAMARIUM EMISSION SPECTRA
    BLAISE, J
    MORILLON, C
    SCHWEIGH.MG
    VERGES, J
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1969, B 24 (08) : 405 - &
  • [33] STUDY OF INFRARED EMISSION SPECTRA USING SISAM .5. EMISSION SPECTRUM OF GADOLINIUM
    BLAISE, J
    CHEVILLARD, J
    VERGES, J
    WYART, JF
    VANKLEEF, TA
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1971, B 26 (01) : 1 - +
  • [34] STUDY OF INFRARED EMISSION SPECTRA USING SISAM .4. EMISSION SPECTRUM OF NEODYMIUM
    BLAISE, J
    CHEVILLARD, J
    VERGES, J
    WYART, JF
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1970, B 25 (07) : 333 - +
  • [35] ABSOLUTE DISTANCE MEASUREMENT BY INFRARED HETERODYNE INTERFEROMETRY
    BOURDET, GL
    FRANCO, MA
    RAAFAT, AM
    ORSZAG, AG
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (12) : 1754 - 1754
  • [36] Profile measurement of glass sheet using multiple wavelength backpropagation interferometry
    Choi, Samuel
    Otsuki, Kohei
    Sasaki, Osami
    Suzuki, Takamasa
    APPLIED OPTICS, 2013, 52 (16) : 3726 - 3731
  • [37] MEASUREMENT OF INTENSITY IN INFRARED SPECTRA
    CHULANOVSKII, VM
    USPEKHI FIZICHESKIKH NAUK, 1959, 68 (01): : 147 - 157
  • [38] PRECISE MEASUREMENT OF INFRARED SPECTRA
    PLYLER, EK
    SCIENCE, 1955, 121 (3148) : 625 - 625
  • [39] Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry
    Keeley, James
    Freeman, Joshua
    Bertling, Karl
    Lim, Yah L.
    Mohandas, Reshma A.
    Taimre, Thomas
    Li, Lianhe H.
    Indjin, Dragan
    Rakic, Aleksandar D.
    Linfield, Edmund H.
    Davies, A. Giles
    Dean, Paul
    SCIENTIFIC REPORTS, 2017, 7
  • [40] Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry
    James Keeley
    Joshua Freeman
    Karl Bertling
    Yah Leng Lim
    Reshma A. Mohandas
    Thomas Taimre
    Lianhe H. Li
    Dragan Indjin
    Aleksandar D. Rakić
    Edmund H. Linfield
    A. Giles Davies
    Paul Dean
    Scientific Reports, 7
12345