共 50 条
- [22] Peak-power reduction for multiple-scan circuits during test application PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000), 2000, : 453 - 458
- [23] Incremental Multiple-Scan Chain Ordering for ECO Flip-Flop Insertion 2013 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2013, : 705 - 712
- [24] Measurement of trench depth by infrared interferometry OPTICS LETTERS, 1999, 24 (23) : 1702 - 1704
- [27] INFRARED EMISSION SPECTRA OF FLAMES JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1948, 40 (06): : 449 - 456