GAP ELECTRON-MOBILITY EMPIRICALLY RELATED TO DONOR CONCENTRATION AND TEMPERATURE

被引:0
|
作者
WEICHOLD, MH
机构
关键词
D O I
10.1016/0038-1101(85)90089-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:957 / 958
页数:2
相关论文
共 50 条
  • [41] DENSITY AND TEMPERATURE EFFECTS ON ELECTRON-MOBILITY IN GASEOUS, CRITICAL, AND LIQUID ETHANE
    GEE, N
    FREEMAN, GR
    PHYSICAL REVIEW A, 1980, 22 (01): : 301 - 309
  • [42] TEMPERATURE-DEPENDENT ELECTRON-MOBILITY AND CLUSTERING IN GAINP2
    FRIEDMAN, DJ
    KIBBLER, AE
    OLSON, JM
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1992, (120): : 383 - 388
  • [43] LOW-TEMPERATURE ELECTRON-MOBILITY IN A DELTA-DOPED SEMICONDUCTOR
    GONZALEZ, LR
    KRUPSKI, J
    SZWACKA, T
    PHYSICAL REVIEW B, 1994, 49 (16): : 11111 - 11116
  • [44] TEMPERATURE-DEPENDENCE OF ELECTRON-MOBILITY AND PEAK VELOCITY IN COMPENSATED GAAS
    XU, JM
    SHUR, M
    APPLIED PHYSICS LETTERS, 1988, 52 (11) : 922 - 923
  • [45] DEPENDENCE OF ELECTRON-MOBILITY ON DOPED IMPURITIES
    CHEN, YF
    KWEI, CM
    SU, P
    TUNG, CJ
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (9A): : 4827 - 4833
  • [46] ON THE LOW FIELD ELECTRON-MOBILITY OF TETRAMETHYLSILANE
    HOLROYD, RA
    SCHMIDT, WF
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1992, 311 (03): : 631 - 632
  • [47] ELECTRON-MOBILITY STUDIES OF THE DONOR NEUTRALIZATION BY ATOMIC-HYDROGEN IN GAAS DOPED WITH SILICON
    JALIL, A
    CHEVALLIER, J
    AZOULAY, R
    MIRCEA, A
    JOURNAL OF APPLIED PHYSICS, 1986, 59 (11) : 3774 - 3777
  • [48] ELECTRON-MOBILITY TRANSITION IN LIQUID ETHERS
    DODELET, JP
    JOU, FY
    FREEMAN, GR
    JOURNAL OF PHYSICAL CHEMISTRY, 1975, 79 (26): : 2876 - 2879
  • [49] ELECTRON-MOBILITY IN HEAVILY DOPED SILICON
    SY, HK
    ONG, CK
    SOLID STATE COMMUNICATIONS, 1984, 52 (10) : 881 - 883
  • [50] ELECTRON-MOBILITY ON THIN HE FILMS
    PAALANEN, MA
    IYE, Y
    PHYSICAL REVIEW LETTERS, 1985, 55 (17) : 1761 - 1764