NATURE OF STACKING-FAULT PYRAMIDS IN (100) EPITAXIAL SILICON

被引：4

作者：

OGDEN, R ^{[1
]}

机构：

[1] PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHANTSHIRE,ENGLAND

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1975年 / 28卷 / 02期

关键词：

D O I：

10.1002/pssa.2210280238

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K97 / K100

页数：4

共 50 条

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