REDUCTION OF PENETRATION EFFECT AT SHARP EDGES IN THE SCANNING ELECTRON-MICROSCOPE (SEM)

被引：2
|
作者：
WELLS, OC
BAILEY, PJ
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 138卷 / APR期
关键词：
D O I：
10.1111/j.1365-2818.1985.tb02590.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：RP3 / RP4
页数：2
相关论文
共 50 条
  • [31] SCANNING GENERATOR FOR SCANNING ELECTRON-MICROSCOPE
    KULYAS, OL
    KAMALYAGIN, AA
    GOLOVENKIN, IA
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1982, 25 (05) : 1249 - 1252
  • [32] SCANNING TUNNELING MICROSCOPE COMBINED WITH SCANNING ELECTRON-MICROSCOPE
    ICHINOKAWA, T
    MIYAZAKI, Y
    KOGA, Y
    ULTRAMICROSCOPY, 1987, 23 (01) : 115 - 118
  • [33] THE COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE
    BARO, AM
    VAZQUEZ, L
    BARTOLOME, A
    GARCIA, R
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 283 - 283
  • [34] THE COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE
    BARO, AM
    VAZQUEZ, L
    BARTOLOME, A
    GARCIA, R
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 283 - 283
  • [35] COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE
    VAZQUEZ, L
    BARTOLOME, A
    GARCIA, R
    BUENDIA, A
    BARO, AM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (08): : 1286 - 1289
  • [36] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE
    GERBER, C
    BINNIG, G
    FUCHS, H
    MARTI, O
    ROHRER, H
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02): : 221 - 224
  • [37] GERM OF MICROSPORIDIAN NOSEMA-GASTEROIDEAE AS SEEN IN SCANNING ELECTRON-MICROSCOPE (SEM)
    ZIZKA, Z
    HOSTOUNSKY, Z
    JOURNAL OF PROTOZOOLOGY, 1977, 24 (04): : A54 - A55
  • [38] MICROTOMOGRAPHY IN A SCANNING ELECTRON-MICROSCOPE
    SASOV, AY
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1986, 53 (02): : 95 - 100
  • [39] ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE
    YAMAGUCHI, T
    YANAO, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (04): : 284 - 284
  • [40] SAMPLING SCANNING ELECTRON-MICROSCOPE
    GOPINATHAN, KG
    GOPINATH, A
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1978, 11 (03): : 229 - 233
12345