REDUCTION OF PENETRATION EFFECT AT SHARP EDGES IN THE SCANNING ELECTRON-MICROSCOPE (SEM)

被引：2

|

作者：

WELLS, OC

BAILEY, PJ

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 138卷 / APR期

关键词：

D O I：

10.1111/j.1365-2818.1985.tb02590.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

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页码：RP3 / RP4

页数：2

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