FURTHER DEVELOPMENTS IN THE ANALYSIS OF CONVERGENT BEAM ELECTRON-DIFFRACTION (CBED) DATA

被引：0

作者：

STEEDS, JW

机构：

来源：

INSTITUTE OF PHYSICS CONFERENCE SERIES | 1983年 / 68期

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D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：31 / 36

页数：6

共 50 条

[41] COMPUTER-SIMULATION OF CONVERGENT BEAM ELECTRON-DIFFRACTION PATTERNS
BLOM, NS
SCHAPINK, FW
ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 : C383 - C383
[42] SOME APPLICATIONS OF CONVERGENT BEAM ELECTRON-DIFFRACTION IN METALLURGICAL RESEARCH
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KOO, JY
PETKOVICLUTON, R
JOURNAL OF METALS, 1983, 35 (06): : 44 - 50
[43] LOCAL MICROSTRAIN AND MISFIT DETERMINATION BY CONVERGENT BEAM ELECTRON-DIFFRACTION
SUNG, CM
WILLIAMS, DB
JOURNAL OF METALS, 1987, 39 (07): : A15 - A16
[44] MY EARLY WORK ON CONVERGENT-BEAM ELECTRON-DIFFRACTION
MOLLENSTEDT, G
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 116 (01): : 13 - 22
[45] A NEW CONDENSER SYSTEM FOR CONVERGENT-BEAM ELECTRON-DIFFRACTION
TOMITA, T
HARADA, Y
JOURNAL OF ELECTRON MICROSCOPY, 1986, 35 (04): : 426 - 429
[46] DETERMINATION OF ARSENIC AND GA PLANES BY CONVERGENT BEAM ELECTRON-DIFFRACTION
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[47] EXAMINATION OF GRAPHITE STRUCTURE BY CONVERGENT-BEAM ELECTRON-DIFFRACTION
GOODMAN, P
ACTA CRYSTALLOGRAPHICA SECTION A, 1976, 32 (SEP1): : 793 - &
[48] COMMENTS ON THE MEASUREMENT OF FOIL THICKNESS BY CONVERGENT BEAM ELECTRON-DIFFRACTION
ECOB, RC
SCRIPTA METALLURGICA, 1986, 20 (07): : 1001 - 1006
[49] SUPPRESSION OF CONTAMINATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION CAMERA
DOWELL, WCT
GOODMAN, P
ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1977, 32 (11): : 1326 - 1327
[50] QUASI-CRYSTALS STUDIED WITH CONVERGENT BEAM ELECTRON-DIFFRACTION
LAST, S
BRONSVELD, PM
BOOM, G
DEHOSSON, JTM
MATERIALS SCIENCE AND ENGINEERING, 1988, 99 : 335 - 337

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