FURTHER DEVELOPMENTS IN THE ANALYSIS OF CONVERGENT BEAM ELECTRON-DIFFRACTION (CBED) DATA

被引：0

作者：

STEEDS, JW

机构：

来源：

INSTITUTE OF PHYSICS CONFERENCE SERIES | 1983年 / 68期

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D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：31 / 36

页数：6

共 50 条

[21] THERMAL VIBRATIONS IN CONVERGENT-BEAM ELECTRON-DIFFRACTION
LOANE, RF
XU, PR
SILCOX, J
ACTA CRYSTALLOGRAPHICA SECTION A, 1991, 47 : 267 - 278
[22] CHARACTERIZATION OF MATERIALS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION
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JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (04): : 293 - 293
[23] INTRODUCTION TO SOME APPLICATIONS OF THE CONVERGENT BEAM ELECTRON-DIFFRACTION
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RIBES, A
PORTIER, R
THOMAS, B
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1983, 8 (06): : 401 - 418
[24] COMPUTER EXPERIMENTS FOR COHERENT CONVERGENT BEAM ELECTRON-DIFFRACTION
KRAKOW, W
COMPUTER SIMULATION OF ELECTRON MICROSCOPE DIFFRACTION AND IMAGES, 1989, : 79 - 105
[25] APPLICATIONS OF CONVERGENT BEAM ELECTRON-DIFFRACTION IN MATERIALS SCIENCE
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JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 13 (01): : 66 - 75
[26] CONVERGENT BEAM ELECTRON-DIFFRACTION NEAR THE CRITICAL VOLTAGE
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[27] CONVERGENT BEAM ELECTRON-DIFFRACTION AND THE DETERMINATION OF CRYSTAL SYMMETRY
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METALS FORUM, 1985, 8 (2-3): : 93 - 108
[28] CRYSTALLOGRAPHIC INFORMATION FROM CONVERGENT BEAM ELECTRON-DIFFRACTION
STEEDS, JW
ULTRAMICROSCOPY, 1981, 7 (01) : 105 - 106
[29] INTRODUCTION TO THE THEORY AND THE PRACTICE OF CONVERGENT BEAM ELECTRON-DIFFRACTION
THOMAS, BJ
PORTIER, R
GANDAIS, M
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1983, 8 (06): : 343 - 399
[30] INVERSION OF CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
BIRD, DM
SAUNDERS, M
ACTA CRYSTALLOGRAPHICA SECTION A, 1992, 48 : 555 - 562

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