AN EXAMINATION OF DEFECTS IN INP SINGLE-CRYSTALS GROWN BY THE LIQUID-ENCAPSULATED CZOCHRALSKI TECHNIQUE USING SYNCHROTRON X-RAY TOPOGRAPHY

被引：8
|
作者：
NAUKKARINEN, K
TUOMI, T
AIRAKSINEN, VM
LAAKSO, KM
LAHTINEN, JA
机构：
来源：
JOURNAL OF CRYSTAL GROWTH | 1983年 / 64卷 / 03期
关键词：
D O I：
10.1016/0022-0248(83)90332-9
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：485 / 491
页数：7
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