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- [5] Characterization of structural defects in MLEK grown InP single crystals using synchrotron white beam X-ray topographyJOURNAL OF CRYSTAL GROWTH, 1997, 174 (1-4) : 230 - 237Chung, HSi, WDudley, MAnselmo, ABliss, DFManiatty, AZhang, HPrasad, V
- [6] THERMAL-ANALYSIS OF LIQUID-ENCAPSULATED CZOCHRALSKI-GROWN INP CRYSTALSMATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1994, 28 (1-3): : 72 - 75FOGLIANI, SMASI, MCARRA, SGUADALUPI, GSMITH, BMEREGALLI, L
- [7] Investigations of structural defects by etching of GaSb grown by the liquid-encapsulated Czochralski techniqueMATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1997, 44 (1-3): : 208 - 212Costa, EMDedavid, BAMuller, A
- [9] SYNCHROTRON X-RAY SECTION TOPOGRAPHY FOR THICK SINGLE-CRYSTALSJOURNAL OF MATERIALS SCIENCE LETTERS, 1983, 2 (03) : 111 - 114NAUKKARINEN, KBLOMBERG, M
- [10] ELECTRICAL CHARACTERISTICS OF ZN IN HEAVILY DOPED INP GROWN BY THE LIQUID-ENCAPSULATED CZOCHRALSKI TECHNIQUEJOURNAL OF APPLIED PHYSICS, 1992, 71 (02) : 659 - 663HIRANO, RKANAZAWA, TINOUE, T