TIME-RESOLVED REFLECTIVITY MEASUREMENTS IN SILICON

被引：7
|
作者：
COMBESCOT, M
BOK, J
机构：
来源：
PHYSICAL REVIEW LETTERS | 1983年 / 51卷 / 06期
关键词：
D O I：
10.1103/PhysRevLett.51.519
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：519 / 519
页数：1
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