EVIDENCE FOR A PERMANENT SINGLE-EVENT UPSET MECHANISM

被引:4
|
作者
MEULENBERG, A
机构
关键词
D O I
10.1109/TNS.1984.4333496
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1280 / 1283
页数:4
相关论文
共 50 条
  • [1] EVIDENCE FOR A PERMANENT SINGLE-EVENT UPSET MECHANISM.
    Meulenberg Jr., A.
    IEEE Transactions on Nuclear Science, 1984, NS-31 (06) : 1280 - 1283
  • [2] Single-event upset effects in optocouplers
    Johnston, AH
    Swift, GM
    Miyahira, T
    Guertin, S
    Edmonds, LD
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2867 - 2875
  • [3] Single-event upset effects in optocouplers
    Johnston, A.H.
    Swift, G.M.
    Miyahira, T.
    Guertin, S.
    Edmonds, L.D.
    IEEE Transactions on Nuclear Science, 1998, 45 (6 pt 1): : 2867 - 2875
  • [4] Single-event upset in flash memories
    Schwartz, HR
    Nichols, DK
    Johnston, AH
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 2315 - 2324
  • [5] INVESTIGATION FOR SINGLE-EVENT UPSET IN MSI DEVICES
    WOODS, JP
    NICHOLS, DK
    PRICE, WE
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) : 4022 - 4025
  • [6] Simulation of single-event upset in power MOSFETs
    Maiti, C. K.
    Dash, T. P.
    PROCEEDINGS OF 2ND INTERNATIONAL CONFERENCE ON 2017 DEVICES FOR INTEGRATED CIRCUIT (DEVIC), 2017, : 25 - 29
  • [7] Dynamic Robust Single-Event Upset Simulator
    Carlisle, Edward
    George, Alan
    JOURNAL OF AEROSPACE INFORMATION SYSTEMS, 2018, 15 (05): : 282 - 296
  • [8] Single-Event Upset testing of the Versatile Transceiver
    Troska, J.
    El Nasr-Storey, S. Seif
    Detraz, S.
    Stejskal, P.
    Sigaud, C.
    Soos, C.
    Vasey, F.
    JOURNAL OF INSTRUMENTATION, 2011, 6
  • [9] Impact of ion energy on single-event upset
    Dodd, P.E.
    Musseau, O.
    Shaneyfelt, M.R.
    Sexton, F.W.
    D'hose, C.
    Hash, G.L.
    Martinez, M.
    Loemker, R.A.
    Leray, J.-L.
    Winokur, P.S.
    IEEE Transactions on Nuclear Science, 1998, 45 (6 pt 1): : 2483 - 2491
  • [10] Impact of ion energy on single-event upset
    Dodd, PE
    Musseau, O
    Shaneyfelt, MR
    Sexton, FW
    D'hose, C
    Hash, GL
    Martinez, M
    Loemker, RA
    Leray, JL
    Winokur, PS
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2483 - 2491