Impact of ion energy on single-event upset

被引：0
|
作者：
Dodd, P.E. [1 ]
Musseau, O. [1 ]
Shaneyfelt, M.R. [1 ]
Sexton, F.W. [1 ]
D'hose, C. [1 ]
Hash, G.L. [1 ]
Martinez, M. [1 ]
Loemker, R.A. [1 ]
Leray, J.-L. [1 ]
Winokur, P.S. [1 ]
机构：
[1] Sandia Natl Lab, Albuquerque, United States
来源：
IEEE Transactions on Nuclear Science | 1998年 / 45卷 / 6 pt 1期
关键词：
Number:; DE-AC04-94AL85000; Acronym:; USDOE; Sponsor: U.S. Department of Energy; -;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：2483 / 2491
相关论文
共 50 条
  • [1] Impact of ion energy on single-event upset
    Dodd, PE
    Musseau, O
    Shaneyfelt, MR
    Sexton, FW
    D'hose, C
    Hash, GL
    Martinez, M
    Loemker, RA
    Leray, JL
    Winokur, PS
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2483 - 2491
  • [2] Impact of heavy ion energy and species on single-event upset in commercial floating gate cells
    Ye, Bing
    Mo, Li-Hua
    Zhai, Peng-Fei
    Cai, Li
    Liu, Tao
    Yin, Ya-Nan
    Sun, You-Mei
    Liu, Jie
    MICROELECTRONICS RELIABILITY, 2021, 120
  • [3] Impact of heavy ion energy and nuclear interactions on single-event upset and latchup in integrated circuits
    Dodd, P. E.
    Schwank, J. R.
    Shaneyfelt, M. R.
    Felix, J. A.
    Paillet, P.
    Ferlet-Cavrois, V.
    Baggio, J.
    Reed, R. A.
    Warren, K. M.
    Weller, R. A.
    Schrimpf, R. D.
    Hash, G. L.
    Dalton, S. M.
    Hirose, K.
    Saito, H.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (06) : 2303 - 2311
  • [4] Single-event upset effects in optocouplers
    Johnston, AH
    Swift, GM
    Miyahira, T
    Guertin, S
    Edmonds, LD
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2867 - 2875
  • [5] Impact of NBTI Aging on the Single-Event Upset of SRAM Cells
    Bagatin, Marta
    Gerardin, Simone
    Paccagnella, Alessandro
    Faccio, Federico
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2010, 57 (06) : 3245 - 3250
  • [6] Single-event upset effects in optocouplers
    Johnston, A.H.
    Swift, G.M.
    Miyahira, T.
    Guertin, S.
    Edmonds, L.D.
    IEEE Transactions on Nuclear Science, 1998, 45 (6 pt 1): : 2867 - 2875
  • [7] Single-event upset in flash memories
    Schwartz, HR
    Nichols, DK
    Johnston, AH
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 2315 - 2324
  • [8] Comparison of single-event upset generated by heavy ion and pulsed laser
    Bin Liang
    Ruiqiang Song
    Jianwei Han
    Yaqing Chi
    Rui Chen
    Chunmei Hu
    Jianjun Chen
    Yingqi Ma
    Shipeng Shangguan
    Science China Information Sciences, 2017, 60
  • [9] Comparison of single-event upset generated by heavy ion and pulsed laser
    Bin LIANG
    Ruiqiang SONG
    Jianwei HAN
    Yaqing CHI
    Rui CHEN
    Chunmei HU
    Jianjun CHEN
    Yingqi MA
    Shipeng SHANGGUAN
    Science China(Information Sciences), 2017, 60 (07) : 243 - 251
  • [10] Comparison of single-event upset generated by heavy ion and pulsed laser
    Liang, Bin
    Song, Ruiqiang
    Han, Jianwei
    Chi, Yaqing
    Chen, Rui
    Hu, Chunmei
    Chen, Jianjun
    Ma, Yingqi
    Shangguan, Shipeng
    SCIENCE CHINA-INFORMATION SCIENCES, 2017, 60 (07)
12345