Impact of ion energy on single-event upset

被引:0
|
作者
Dodd, P.E. [1 ]
Musseau, O. [1 ]
Shaneyfelt, M.R. [1 ]
Sexton, F.W. [1 ]
D'hose, C. [1 ]
Hash, G.L. [1 ]
Martinez, M. [1 ]
Loemker, R.A. [1 ]
Leray, J.-L. [1 ]
Winokur, P.S. [1 ]
机构
[1] Sandia Natl Lab, Albuquerque, United States
来源
IEEE Transactions on Nuclear Science | 1998年 / 45卷 / 6 pt 1期
关键词
Number:; DE-AC04-94AL85000; Acronym:; USDOE; Sponsor: U.S. Department of Energy; -;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:2483 / 2491
相关论文
共 50 条
  • [21] Physical Mechanisms Inducing Electron Single-Event Upset
    Caron, P.
    Inguimbert, C.
    Artola, L.
    Chatry, N.
    Sukhaseum, N.
    Ecoffet, R.
    Bezerra, F.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 65 (08) : 1759 - 1767
  • [22] A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area
    Song, Ruiqiang
    Shao, Jinjin
    Liang, Bin
    Chi, Yaqing
    Chen, Jianjun
    2019 IEEE 13TH INTERNATIONAL CONFERENCE ON ASIC (ASICON), 2019,
  • [23] BRAM Implementation of a Single-Event Upset Sensor for Adaptive Single-Event Effect Mitigation in Reconfigurable FPGAs
    Glein, Robert
    Mengs, Philipp
    Rittner, Florian
    Wansch, Rainer
    Heuberger, Albert
    2017 NASA/ESA CONFERENCE ON ADAPTIVE HARDWARE AND SYSTEMS (AHS), 2017, : 1 - 8
  • [24] Single-Event Upset in Molecular Quantum Cellular Automata
    Rahimi, Ehsan
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2024, 23 : 541 - 548
  • [25] SINGLE-EVENT UPSET IN GAAS E/D MESFET LOGIC
    HUGHLOCK, BW
    LARUE, GS
    JOHNSTON, AH
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) : 1894 - 1901
  • [26] Experimental study of temperature dependence of single-event upset in SRAMs
    Li Cai
    Gang Guo
    Jian-Cheng Liu
    Hui Fan
    Shu-Ting Shi
    Hui Wang
    Gui-Liang Wang
    Dong-Jun Shen
    Ning HUI
    An-Lin He
    Nuclear Science and Techniques, 2016, 27
  • [27] Fundamentals of the pulsed laser technique for single-event upset testing
    Fouillat, Pascal
    Pouget, Vincent
    McMorrow, Dale
    Darracq, Frederic
    Buchner, Stephen
    Lewis, Dean
    RADIATION EFFECTS ON EMBEDDED SYSTEMS, 2007, : 121 - +
  • [28] Experimental study of temperature dependence of single-event upset in SRAMs
    Cai, Li
    Guo, Gang
    Liu, Jian-Cheng
    Fan, Hui
    Shi, Shu-Ting
    Wang, Hui
    Wang, Gui-Liang
    Shen, Dong-Jun
    Hui, Ning
    He, An-Lin
    NUCLEAR SCIENCE AND TECHNIQUES, 2016, 27 (01)
  • [29] Estimation of the Single-Event Upset Sensitivity of Advanced SOI SRAMs
    Raine, M.
    Gaillardin, M.
    Lagutere, T.
    Duhamel, O.
    Paillet, P.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 65 (01) : 339 - 345
  • [30] INVESTIGATION OF SINGLE-EVENT UPSET (SEU) IN AN ADVANCED BIPOLAR PROCESS
    ZOUTENDYK, JA
    SECREST, EC
    BERNDT, DF
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) : 1573 - 1577