EVIDENCE FOR A PERMANENT SINGLE-EVENT UPSET MECHANISM

被引：4
|
作者：
MEULENBERG, A
机构：
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1984年 / 31卷 / 06期
关键词：
D O I：
10.1109/TNS.1984.4333496
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1280 / 1283
页数：4
相关论文
共 50 条
  • [11] Simulation Study on the Charge Collection Mechanism of FinFET Devices in Single-Event Upset
    Zhang, Hongwei
    Guo, Yang
    Wang, Shida
    Sun, Yi
    Mei, Bo
    Tang, Min
    Liu, Jingyi
    MICROMACHINES, 2024, 15 (02)
  • [12] Device simulation of charge collection and single-event upset
    Dodd, PE
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (02) : 561 - 575
  • [13] DrSEUs: A Dynamic Robust Single-Event Upset Simulator
    Carlisle, Edward
    Wulf, Nicholas
    MacKinnon, James
    George, Alan
    2016 IEEE AEROSPACE CONFERENCE, 2016,
  • [14] Single-event upset in the PowerPC750 microprocessor
    Swift, GM
    Farmanesh, FF
    Guertin, SM
    Irom, F
    Millward, DG
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2001, 48 (06) : 1822 - 1827
  • [15] GENERAL UPPER BOUND ON SINGLE-EVENT UPSET RATE
    CHLOUBER, D
    ONEILL, P
    POLLOCK, J
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (02) : 1065 - 1071
  • [16] Physical Mechanisms Inducing Electron Single-Event Upset
    Caron, P.
    Inguimbert, C.
    Artola, L.
    Chatry, N.
    Sukhaseum, N.
    Ecoffet, R.
    Bezerra, F.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 65 (08) : 1759 - 1767
  • [17] BRAM Implementation of a Single-Event Upset Sensor for Adaptive Single-Event Effect Mitigation in Reconfigurable FPGAs
    Glein, Robert
    Mengs, Philipp
    Rittner, Florian
    Wansch, Rainer
    Heuberger, Albert
    2017 NASA/ESA CONFERENCE ON ADAPTIVE HARDWARE AND SYSTEMS (AHS), 2017, : 1 - 8
  • [18] Single-Event Upset in Molecular Quantum Cellular Automata
    Rahimi, Ehsan
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2024, 23 : 541 - 548
  • [19] SINGLE-EVENT UPSET IN GAAS E/D MESFET LOGIC
    HUGHLOCK, BW
    LARUE, GS
    JOHNSTON, AH
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) : 1894 - 1901
  • [20] Experimental study of temperature dependence of single-event upset in SRAMs
    Li Cai
    Gang Guo
    Jian-Cheng Liu
    Hui Fan
    Shu-Ting Shi
    Hui Wang
    Gui-Liang Wang
    Dong-Jun Shen
    Ning HUI
    An-Lin He
    Nuclear Science and Techniques, 2016, 27
12345