INFLUENCE OF SOURCE-DRAIN SERIES RESISTANCE ON MOSFET FIELD-EFFECT MOBILITY

被引：17
|
作者：
CABONTILL, B
GHIBAUDO, G
CRISTOLOVEANU, S
机构：
[1] Ecole Natl Superieure d'Electronique, et de Radio-Electricite de Grenoble,, Lab de Physique des Composants a, Ecole Natl Superieure d'Electronique et de Radio-Electricite de Grenoble, Lab de Physique des Compo
来源：
ELECTRONICS LETTERS | 1985年 / 21卷 / 11期
关键词：
D O I：
10.1049/el:19850324
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
4
引用
收藏
页码：457 / 458
页数：2
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