HIGH-RESOLUTION TEM STUDY OF THE SI(001)/SIO2 INTERFACE

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作者：
DANTERROCHES, C
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JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1984年 / 9卷 / 03期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：147 / &
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