ASIC TESTING WITH HIGH FAULT COVERAGE

被引：0
|
作者：
BUTZERIN, T [1 ]
SAMAD, A [1 ]
ARCHAMBEAU, E [1 ]
机构：
[1] VLSI TECHNOL INC,SOFTWEAR DEV,SAN JOSE,CA 95131
来源：
VLSI SYSTEMS DESIGN | 1988年 / 9卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：50 / &
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