DETERMINATION OF THICKNESS OF CDS THIN-FILMS USING A QUASI-EXPONENTIAL DECAY OF REFRACTIVE-INDEX WITH WAVELENGTH

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作者：
CHATTERJEE, AK
DEY, KK
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NATIONAL ACADEMY SCIENCE LETTERS-INDIA | 1985年 / 8卷 / 03期
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O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
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07 ; 0710 ; 09 ;
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页码：93 / 96
页数：4
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