DIELECTRIC-BREAKDOWN STUDY OF THIN LA2O3 FILMS

被引:13
|
作者
SINGH, A
机构
关键词
D O I
10.1016/0040-6090(83)90205-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:163 / 168
页数:6
相关论文
共 50 条
  • [31] Molecular dynamics simulations of La2O3 thin films on SiO2
    Fang, Mou
    Kelty, Stephen P.
    He, Xiangming
    JOURNAL OF ENERGY CHEMISTRY, 2014, 23 (03) : 282 - 286
  • [32] WEIBULL STATISTICS IN SHORT-TERM DIELECTRIC-BREAKDOWN OF THIN POLYETHYLENE FILMS
    CACCIARI, M
    MAZZANTI, G
    MONTANARI, GC
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 1994, 1 (01) : 153 - 159
  • [33] A MODEL FOR DIELECTRIC-BREAKDOWN IN PLASMA-POLYMERIZED STYRENE THIN-FILMS
    HIKITA, M
    MATSUDA, A
    NAGAO, M
    SAWA, G
    IEDA, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1982, 21 (03): : 483 - 489
  • [34] NATURE OF DIELECTRIC-BREAKDOWN IN ULTRATHIN LANGMUIR FILMS
    SRIVASTAVA, VK
    ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1976, 3 (02): : 117 - 117
  • [35] SOME OBSERVATIONS ON DIELECTRIC-BREAKDOWN IN INSULATING FILMS
    DUBEY, GC
    THIN SOLID FILMS, 1981, 78 (03) : 263 - 269
  • [36] Molecular dynamics simulations of La2O3 thin films on SiO2
    Mou Fang
    Stephen P.Kelty
    Xiangming He
    Journal of Energy Chemistry , 2014, (03) : 282 - 286
  • [37] Electrical characteristics of high-K stack gate dielectric thin films with La2O3 as a buffer layer
    Ueda, I
    PHYSICS AND TECHNOLOGY OF HIGH-K GATE DIELECTRICS II, 2004, 2003 (22): : 403 - 414
  • [38] DIELECTRIC-BREAKDOWN OF POROUS MGAL2O4
    RUPAAL, AS
    GARNIER, JE
    BATES, JL
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1981, 64 (07) : C100 - C101
  • [39] DIELECTRIC BREAKDOWN IN THIN ANODIZED Y2O3 FILMS.
    Noya, Atsushi
    Nakagawa, Hiromasa
    Kuriki, Shinya
    Matsumoto, Goro
    Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E, 1981, E64 (04): : 252 - 257
  • [40] DIELECTRIC-BREAKDOWN IN THIN PLASMA NITRIDED SIO2 LAYERS
    FAZAN, PC
    HELVETICA PHYSICA ACTA, 1988, 61 (1-2): : 112 - 116