QUANTITATIVE-EVALUATION OF MICROMAGNETIC FIELDS BY MEANS OF A SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

ELSBROCK, JB ^{[1
]}

BALK, LJ ^{[1
]}

机构：

[1] UNIV DUISBURG,FACHGEBIET WERKSTOFFE ELEKTROTECH,D-4100 DUISBURG,FED REP GER

来源：

SCANNING ELECTRON MICROSCOPY | 1984年

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：131 / 139

页数：9

共 50 条

[31] MICROMANIPULATOR FOR SCANNING ELECTRON-MICROSCOPE
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