QUANTITATIVE-EVALUATION OF MICROMAGNETIC FIELDS BY MEANS OF A SCANNING ELECTRON-MICROSCOPE

被引：0
|
作者：
ELSBROCK, JB [1 ]
BALK, LJ [1 ]
机构：
[1] UNIV DUISBURG,FACHGEBIET WERKSTOFFE ELEKTROTECH,D-4100 DUISBURG,FED REP GER
来源：
SCANNING ELECTRON MICROSCOPY | 1984年
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：131 / 139
页数：9
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