Atomic force microscope in a contactless mode: Peculiarities of force interactions

被引：0
|
作者：
S. Sh. Rekhviashvili
机构：
[1] Russian Academy of Sciences,Institute of Applied Mathematics and Automation, Kabardino
来源：
Technical Physics Letters | 2000年 / 26卷
关键词：
Atomic Force Microscope; Force Interaction; Probe Structure; Continuous Approximation; Point Shape;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Forces of interaction between the atomic force microscope (AFM) probe and the surface of a solid are calculated with an allowance for the induced cantilever oscillations. A continuous approximation used in this work does not take into account discreteness of the sample and probe structures. Calculations have been performed for various AFM point shapes. It is theoretically demonstrated that the cantilever oscillations increase the interaction force.
引用
收藏
页码：517 / 519
页数：2
相关论文
共 50 条
  • [41] Intersegmental interactions in supercoiled DNA: atomic force microscope study
    Shlyakhtenko, LS
    Miloseska, L
    Potaman, VN
    Sinden, RR
    Lyubchenko, YL
    ULTRAMICROSCOPY, 2003, 97 (1-4) : 263 - 270
  • [42] Comparison of Structure Stability of Graphene and MXene by Peak Force Tapping Mode of Atomic Force Microscope
    Chen L.
    Cheong L.
    Shen C.
    Liu Z.
    Cailiao Daobao/Materials Reports, 2021, 35 (22): : 22006 - 22010
  • [43] A critical look at surface force measurement using a commercial atomic force microscope in the noncontact mode
    Fontaine, P
    Guenoun, P
    Daillant, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (11): : 4145 - 4151
  • [44] Improved atomic force microscope
    Eroshenko, Yu N.
    PHYSICS-USPEKHI, 2009, 52 (10) : 1081 - 1081
  • [45] Adaptive Atomic Force Microscope
    Schmidt, Patrick D.
    Reichert, Benjamin H.
    Lajoie, John G.
    Sivasankar, Sanjeevi
    SINGLE MOLECULE SPECTROSCOPY AND SUPERRESOLUTION IMAGING XIII, 2020, 11246
  • [46] THE ATOMIC FORCE MICROSCOPE AND FO
    RODGERS, M
    PHOTONICS SPECTRA, 1991, 25 (01) : 98 - &
  • [47] Moire in atomic force microscope
    Chen, H
    Liu, D
    Lee, A
    EXPERIMENTAL TECHNIQUES, 2000, 24 (01) : 31 - 32
  • [48] Optomechanical atomic force microscope
    He, Fei
    Liu, Jian
    Zhu, Ka-Di
    NANOTECHNOLOGY, 2021, 32 (08)
  • [49] Nanolithography with an atomic force microscope
    Wendel, M
    Irmer, B
    Cortes, J
    Kaiser, R
    Lorenz, H
    Kotthaus, JP
    Lorke, A
    Williams, E
    SUPERLATTICES AND MICROSTRUCTURES, 1996, 20 (03) : 349 - 356
  • [50] APPLICATIONS OF THE ATOMIC FORCE MICROSCOPE
    MEYER, E
    GRUTTER, P
    HEINZELMANN, H
    ROSENTHALER, L
    HIDBER, HR
    GUNTHERODT, HJ
    HELVETICA PHYSICA ACTA, 1988, 61 (1-2): : 179 - 179
12345