Atomic force microscope in a contactless mode: Peculiarities of force interactions

被引：0
|
作者：
S. Sh. Rekhviashvili
机构：
[1] Russian Academy of Sciences,Institute of Applied Mathematics and Automation, Kabardino
来源：
Technical Physics Letters | 2000年 / 26卷
关键词：
Atomic Force Microscope; Force Interaction; Probe Structure; Continuous Approximation; Point Shape;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Forces of interaction between the atomic force microscope (AFM) probe and the surface of a solid are calculated with an allowance for the induced cantilever oscillations. A continuous approximation used in this work does not take into account discreteness of the sample and probe structures. Calculations have been performed for various AFM point shapes. It is theoretically demonstrated that the cantilever oscillations increase the interaction force.
引用
收藏
页码：517 / 519
页数：2
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