Processability and reliability of nonconductive adhesives (NCAs) in fine-pitch chip-on-flex applications

被引:0
|
作者
W. K. Chiang
Y. C. Chan
Brian Ralph
Andrew Holland
机构
[1] City University of Hong Kong,Department of Electronic Engineering
[2] Brunel University,School of Engineering and Design
来源
Journal of Electronic Materials | 2006年 / 35卷
关键词
Fine pitch; nonconductive adhesive; NCA; reliability; contact resistance;
D O I
暂无
中图分类号
学科分类号
摘要
The use of NCAs to form direct contact interconnections between chip bumps and substrate pads have become a viable option in interconnection technology for fine-pitch applications. However, the primary concerns with NCAs are their long-term reliability, stability, and consistent electrical performance in particulate interconnections. Results of assembly process studies and environmental testing using NCAs on flexible substrates are analyzed and discussed herein. An extensive design experiment was performed to determine which process parameters were critical in obtaining good electrical connections. A reliability evaluation of NCAs for flexible substrate applications was carried out to gain more insight into the failure mechanisms of this type of interconnect. Pressure cooker test results showed that failures occurring in NCA joints are primarily due to moisture absorption, which could lead to interfacial delamination at the substrate/adhesive interface, accompanied by hygroscopic swelling. NCAs with lower coefficients of thermal expansion also exhibited better contact resistance stability during high-temperature storage tests.
引用
收藏
页码:443 / 452
页数:9
相关论文
共 50 条
  • [31] The development and reliability of small pitch flip chip on flex process
    Palm, P
    Määttänen, J
    Tuominen, A
    Jalonen, P
    ADVANCES IN ELECTRONIC MATERIALS AND PACKAGING 2001, 2001, : 428 - 432
  • [32] Design, assembly and reliability of large die and fine-pitch Cu/low-k flip chip package
    Ong, Yue Ying
    Ho, Soon Wee
    Vaidyanathan, Kripesh
    Sekhar, Vasarla Nagendra
    Jong, Ming Chinq
    Long, Samuel Lim Yak
    Sheng, Vincent Lee Wen
    Wai, Leong Ching
    Rao, Vempati Srinivasa
    Ong, Jimmy
    Ong, Xuefen
    Zhang, Xiaowu
    Seung, Yoon Uk
    Lau, John H.
    Lim, Yeow Kheng
    Yeo, David
    Chan, Kai Chong
    Zhang Yanfeng
    Tan, Juan Boon
    Sohn, Dong Kyun
    MICROELECTRONICS RELIABILITY, 2010, 50 (07) : 986 - 994
  • [33] An Accommodative Approach Designed in Heat Dispersion of Fine-Pitch Chip-On-Film Packages for LCD Applications
    Tsai, C. I.
    Liu, A. H.
    Ho, S. C.
    Liu, D. S.
    Yeh, S. S.
    Chang, Y. F.
    2008 EMAP CONFERENCE PROCEEDINGS, 2008, : 98 - +
  • [34] Reliability of ultra-thin chip-on-flex (UTCOF) with anisotropic conductive adhesive (ACA) joints
    Lu, Su-Tsai
    Chen, Wen-Hwa
    58TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, PROCEEDINGS, 2008, : 1287 - 1293
  • [35] Bending and reliability test of chip-on-flex (COF) assembly using anisotropic conductive films (ACFs)
    Yip, Ming-Chuen
    Huang, Chien-Yuan
    Chen, Chien-Liang
    Lu, Su-Tsai
    ICEPT: 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2007, : 726 - +
  • [36] Evaluation of Fine-Pitch Chip-to-Chip Interconnects Using ACF Material with Arrayed Particles
    Huang, Yu-Wei
    Lu, Su-Tsai
    Peng, Jon-Shiou
    Fan, Chia-Wen
    Chung, Su-Ching
    Chen, Su-Mei
    Lu, Yu-Lan
    Chang, Pai-Cheng
    Zhan, Chau-Jie
    2012 7TH INTERNATIONAL MICROSYSTEMS, PACKAGING, ASSEMBLY AND CIRCUITS TECHNOLOGY CONFERENCE (IMPACT), 2012,
  • [37] Reliability of Fine-Pitch Flip-Chip (COG) Bonding with Non-Conductive Film Using Ultrasonic Energy
    Jo, Jung-Lae
    Lee, Jong-Bum
    Kim, Jong-Min
    Shin, Young-Eui
    Jung, Seung-Boo
    JOURNAL OF ADHESION, 2010, 86 (5-6): : 470 - 479
  • [38] Reliability studies of anisotropic conductive adhesives in flex to LCD applications
    Murray, CT
    Hogerton, PB
    Chheang, T
    Rudman, RL
    2000 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, 2000, 4339 : 820 - 825
  • [39] Optimisation modelling for thermal fatigue reliability of lead-free interconnects in fine-pitch flip-chip packaging
    Stoyanov, Swyan
    Bailey, Chris
    Desmulliez, Marc
    SOLDERING & SURFACE MOUNT TECHNOLOGY, 2009, 21 (01) : 11 - 24
  • [40] Interfacial reaction and joint reliability of fine-pitch flip-chip solder bump using stencil printing method
    Ha, Sang-Su
    Kim, Dae-Gon
    Kim, Jong-Woong
    Yoon, Jeong-Won
    Joo, Jin-Ho
    Shin, Young-Eui
    Jung, Seung-Boo
    MICROELECTRONIC ENGINEERING, 2007, 84 (11) : 2640 - 2645