Processability and reliability of nonconductive adhesives (NCAs) in fine-pitch chip-on-flex applications

被引:0
|
作者
W. K. Chiang
Y. C. Chan
Brian Ralph
Andrew Holland
机构
[1] City University of Hong Kong,Department of Electronic Engineering
[2] Brunel University,School of Engineering and Design
来源
Journal of Electronic Materials | 2006年 / 35卷
关键词
Fine pitch; nonconductive adhesive; NCA; reliability; contact resistance;
D O I
暂无
中图分类号
学科分类号
摘要
The use of NCAs to form direct contact interconnections between chip bumps and substrate pads have become a viable option in interconnection technology for fine-pitch applications. However, the primary concerns with NCAs are their long-term reliability, stability, and consistent electrical performance in particulate interconnections. Results of assembly process studies and environmental testing using NCAs on flexible substrates are analyzed and discussed herein. An extensive design experiment was performed to determine which process parameters were critical in obtaining good electrical connections. A reliability evaluation of NCAs for flexible substrate applications was carried out to gain more insight into the failure mechanisms of this type of interconnect. Pressure cooker test results showed that failures occurring in NCA joints are primarily due to moisture absorption, which could lead to interfacial delamination at the substrate/adhesive interface, accompanied by hygroscopic swelling. NCAs with lower coefficients of thermal expansion also exhibited better contact resistance stability during high-temperature storage tests.
引用
收藏
页码:443 / 452
页数:9
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