Structural, Thermal and Luminescence Properties of AlN:Tm Thin Films Deposited on Silicon Substrate and Optical Fiber

被引：0
|
作者：
Amani Muhammad Maqbool
Dunja Alruwaili
Tahirzeb Milinovic
Ghafar Khan
Iftikhar Ali
机构：
[1] Department of Clinical and Diagnostic Sciences,
[2] the University of Alabama at Birmingham,undefined
[3] Department of Physics & Astronomy,undefined
[4] Ball State University,undefined
[5] Department of Physics,undefined
[6] Abdul Wali Khan University,undefined
[7] Physics Research Division,undefined
[8] PINSTECH,undefined
[9] Abbottabad University of Science and Technology,undefined
来源：
Semiconductors | 2018年 / 52卷
关键词：
thin films; structural analysis; X-ray diffraction; luminescence; aluminum nitride;
D O I：
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中图分类号：
学科分类号：
摘要：
引用
收藏
页码：2039 / 2045
页数：6
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