Structural, Thermal and Luminescence Properties of AlN:Tm Thin Films Deposited on Silicon Substrate and Optical Fiber

被引：0
|
作者：
Amani Muhammad Maqbool
Dunja Alruwaili
Tahirzeb Milinovic
Ghafar Khan
Iftikhar Ali
机构：
[1] Department of Clinical and Diagnostic Sciences,
[2] the University of Alabama at Birmingham,undefined
[3] Department of Physics & Astronomy,undefined
[4] Ball State University,undefined
[5] Department of Physics,undefined
[6] Abdul Wali Khan University,undefined
[7] Physics Research Division,undefined
[8] PINSTECH,undefined
[9] Abbottabad University of Science and Technology,undefined
来源：
Semiconductors | 2018年 / 52卷
关键词：
thin films; structural analysis; X-ray diffraction; luminescence; aluminum nitride;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：2039 / 2045
页数：6
相关论文
共 50 条
  • [11] Structural and optical properties of polycrystalline silicon thin films deposited by PECVD method
    Zhu, FR
    Kohara, H
    Fuyuki, T
    Matsunami, H
    CONFERENCE RECORD OF THE TWENTY FIFTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1996, 1996, : 709 - 712
  • [12] Structural and Optical properties of Sputtered AlN Thin Films
    Panda, Padmalochan
    Ramaseshan, R.
    Sundari, S. Tripura
    Rajaraman, R.
    Suematsu, H.
    Dash, S.
    61ST DAE-SOLID STATE PHYSICS SYMPOSIUM, 2017, 1832
  • [13] Effect of substrate temperature on structural and optical properties of spray deposited ZnO thin films
    Larbah, Y.
    Adnane, M.
    Sahraoui, T.
    MATERIALS SCIENCE-POLAND, 2015, 33 (03): : 491 - 496
  • [14] Impact of the surface-near silicon substrate properties on the microstructure of sputter-deposited AlN thin films
    Schneider, M.
    Bittner, A.
    Patocka, F.
    Stoeger-Pollach, M.
    Halwax, E.
    Schmid, U.
    APPLIED PHYSICS LETTERS, 2012, 101 (22)
  • [15] Structural and optical properties of AlN/GaN and AlN/AlGaN/GaN thin films on silicon substrate prepared by plasma assisted molecular beam epitaxy (MBE)
    Jing, Ho Xin
    Abdullah, Che Azurahanim Che
    Yusoff, Mohd Zaki Mohd
    Mahyuddin, Azzafeerah
    Hassan, Zainuriah
    RESULTS IN PHYSICS, 2019, 12 : 1177 - 1181
  • [16] Influence of the substrate temperature on the structural, optical, and electrical properties of tin selenide thin films deposited by thermal evaporation method
    Kumar, N.
    Sharma, V.
    Padha, N.
    Shah, N. M.
    Desai, M. S.
    Panchal, C. J.
    Protsenko, I. Yu.
    CRYSTAL RESEARCH AND TECHNOLOGY, 2010, 45 (01) : 53 - 58
  • [17] Correlation between structural and transport properties of silicon thin films deposited at various substrate temperatures
    Roy, D
    Das, C
    Longeaud, C
    Houzé, F
    Ray, S
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (03): : 1048 - 1054
  • [18] Effect of annealing temperature on optical and electrical properties of metallophthalocyanine thin films deposited on silicon substrate
    Skonieczny, R.
    Popielarski, P.
    Bala, W.
    Fabisiak, K.
    Paprocki, K.
    Jancelewicz, M.
    Kowalska, M.
    Szybowicz, M.
    MATERIALS SCIENCE-POLAND, 2016, 34 (03): : 676 - 683
  • [19] Optical and thermal characterization of AlN thin films deposited by pulsed laser deposition
    Jacquot, A
    Lenoir, B
    Dauscher, A
    Verardi, P
    Craciun, F
    Stölzer, M
    Gartner, M
    Dinescu, M
    APPLIED SURFACE SCIENCE, 2002, 186 (1-4) : 507 - 512
  • [20] Influence of filament-to-substrate distance on the spectroscopic, structural and optical properties of silicon carbide thin films deposited by HWCVD technique
    Tehrani, Fatemeh Shariatmadar
    Rahman, Saadah Abdul
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2014, 25 (05) : 2366 - 2373
12345