Low-Frequency Glow Discharge Deposition of a Silicon Dioxide Film onto the Surface of Glass Microspheres

被引:0
|
作者
V. M. Izgorodin
Yu. V. Tolokonnikova
A. A. Aushev
E. G. Orlikova
I. V. Sevryugin
机构
[1] Russian Federal Nuclear Center,All
来源
High Energy Chemistry | 2001年 / 35卷
关键词
Refractive Index; Glow Discharge; Discharge Plasma; Tetraethoxysilane; Thick Wall;
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学科分类号
摘要
Laser fusion research demands microsized hollow shells with a large diameter and a thick wall. Because these geometric parameters are difficult to provide by fabrication, the wall thickness was increased by deposition of a silicon dioxide film on the outer surface of glass microspheres. The film was obtained by decomposition of tetraethoxysilane vapor in a low-frequency discharge plasma in mixtures with argon and oxygen. The thickness of coating was shown to be a linear function of the deposition time and the consumption of the precursor organoelement compound. The composition of plasma-deposited layers was studied and their density and refractive index were determined. Elemental analysis data showed that the coating comprised silicon dioxide with carbon and hydrogen impurities.
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页码:123 / 127
页数:4
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