A new approach to integrate PLZT thin films with micro-cantilevers

被引:0
|
作者
Ravindra Singh
T. C. Goel
Sudhir Chandra
机构
[1] Indian Institute of Technology Delhi,Centre for Applied Research in Electronics
[2] BITS Pilani Goa Campus,undefined
来源
Sadhana | 2009年 / 34卷
关键词
PLZT thin films; pure perovskite phase; RF sputtering; lift-off process; micro-cantilevers;
D O I
暂无
中图分类号
学科分类号
摘要
In the present work, we report the preparation of PLZT thin films in pure perovskite phase by RF magnetron sputtering without external substrate heating and their integration with micro-cantilevers. The ‘lift-off’ process for patterning different layers of a micro-cantilever including PLZT, Pt/Ti and Au/Cr was employed. The basic requirement of lift-off process is that the deposition temperature should not exceed 200°C otherwise photoresist will burn out. Therefore, one of the aims of the present work was to prepare PLZT film at lower deposition temperatures, which can be subsequently annealed to form pure perovskite phase. This also strongly favours the incorporation of ‘lift-off’ process for patterning in the complete process flow. As no external substrate heating was required in the deposition of PLZT film, this objective has been successfully accomplished in the present work. The ‘lift-off’ process has been successfully adopted for patterning the composite layers of PLZT/Pt/Ti and Au/Cr using thick positive photo-resist (STR-1045). Different types of cantilever beams incorporating PLZT films have been successfully fabricated using ‘lift-off’ process and bulk micromachining technology. The proposed process can be advantageously applied for the fabrication of various MEMS devices.
引用
收藏
页码:563 / 572
页数:9
相关论文
共 50 条
  • [41] Fracture behavior and deformation mechanisms in nanolaminated crystalline/amorphous micro-cantilevers
    Wang, Y. Q.
    Fritz, R.
    Kiener, D.
    Zhang, J. Y.
    Liu, G.
    Kolednik, O.
    Pippan, R.
    Sun, J.
    ACTA MATERIALIA, 2019, 180 : 73 - 83
  • [42] Calibrating torsional eigenmodes of micro-cantilevers for dynamic measurement of frictional forces
    Thoren, Per-Anders
    Borgani, Riccardo
    Forchheimer, Daniel
    Haviland, David B.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 89 (07):
  • [43] Fracture mechanical testing of single crystal notched α-iron micro-cantilevers
    Snartland, B. D.
    Hagen, A. B.
    Thaulow, C.
    ENGINEERING FRACTURE MECHANICS, 2017, 175 : 312 - 323
  • [44] Sample geometry effect on mechanical property of gold micro-cantilevers by micro-bending test
    Suzuki, Kosuke
    Chang, Tso-Fu Mark
    Hashigata, Ken
    Asano, Keisuke
    Chen, Chun-Yi
    Nagoshi, Takashi
    Yamane, Daisuke
    Ito, Hiroyuki
    Machida, Katsuyuki
    Masu, Kazuya
    Sone, Masato
    MRS COMMUNICATIONS, 2020, 10 (03) : 434 - 438
  • [45] Adhesion of micro-cantilevers subjected to mechanical point loading: modeling and experiments
    Jones, EE
    Begley, MR
    Murphy, KD
    JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 2003, 51 (08) : 1601 - 1622
  • [46] Curled micro-cantilevers using benzocyclobutene polymer and Mo for wafer level probing
    Lee, SH
    Kim, BC
    SENSORS AND ACTUATORS A-PHYSICAL, 2005, 121 (02) : 472 - 479
  • [47] Piezoelectric properties of micro-machined cantilever PLZT thin films
    Cheng, CH
    Xu, YH
    Cherry, HB
    Tseng, J
    Um, G
    Wen, WJ
    Mackenzie, JD
    FERROELECTRICS, 1999, 232 (1-4) : 1039 - 1044
  • [48] Density measurement sensitivity of micro-cantilevers influenced by shape dimensions and operation modes
    Zhao, Libo
    Hu, Yingjie
    Hebibul, Rahman
    Xia, Yong
    Huang, Linya
    Zhao, Yulong
    Jiang, Zhuangde
    SENSORS AND ACTUATORS B-CHEMICAL, 2017, 245 : 574 - 582
  • [49] Multimodal analysis of force spectroscopy based on a transfer function study of micro-cantilevers
    Vazquez, Rafael
    Rubio-Sierra, F. Javier
    Stark, Robert W.
    NANOTECHNOLOGY, 2007, 18 (18)
  • [50] Fabrication and characterisation of triangle-faced single crystal diamond micro-cantilevers
    Kupfer, Benjamin Z.
    Ahmad, Rezal K.
    Zainal, Aiman
    Jackman, Richard B.
    DIAMOND AND RELATED MATERIALS, 2010, 19 (7-9) : 742 - 747