Quantitative trait loci for resistance to stripe rust of wheat revealed using global field nurseries and opportunities for stacking resistance genes

被引：0
|
作者：
Firdissa E. Bokore
Richard D. Cuthbert
Ron E. Knox
Harpinder S. Randhawa
Colin W. Hiebert
Ron M. DePauw
Asheesh K. Singh
Arti Singh
Andrew G. Sharpe
Amidou N’Diaye
Curtis J. Pozniak
Curt McCartney
Yuefeng Ruan
Samia Berraies
Brad Meyer
Catherine Munro
Andy Hay
Karim Ammar
Julio Huerta-Espino
Sridhar Bhavani
机构：
[1] Agriculture and Agri-Food Canada,Swift Current Research and Development Center
[2] Agriculture and Agri-Food Canada,Lethbridge Research and Development Center
[3] Agriculture and Agri-Food Canada,Morden Research and Development Centre
[4] Advancing Wheat Technologies,Department of Agronomy
[5] Iowa State University,Department of Plant Sciences
[6] National Research Council of Canada,undefined
[7] University of Saskatchewan,undefined
[8] Plant and Food Research Canterbury Agriculture and Science Centre,undefined
[9] International Maize and Wheat Improvement Center (CIMMYT),undefined
[10] Campo Experimental Valle de México INIFAP,undefined
[11] International Maize and Wheat Improvement Center (CIMMYT),undefined
来源：
Theoretical and Applied Genetics | 2017年 / 130卷
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摘要：
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页码：2617 / 2635
页数：18
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