Quantitative trait loci for resistance to stripe rust of wheat revealed using global field nurseries and opportunities for stacking resistance genes

被引：0

作者：

Firdissa E. Bokore

Richard D. Cuthbert

Ron E. Knox

Harpinder S. Randhawa

Colin W. Hiebert

Ron M. DePauw

Asheesh K. Singh

Arti Singh

Andrew G. Sharpe

Amidou N’Diaye

Curtis J. Pozniak

Curt McCartney

Yuefeng Ruan

Samia Berraies

Brad Meyer

Catherine Munro

Andy Hay

Karim Ammar

Julio Huerta-Espino

Sridhar Bhavani

机构：

[1] Agriculture and Agri-Food Canada,Swift Current Research and Development Center

[2] Agriculture and Agri-Food Canada,Lethbridge Research and Development Center

[3] Agriculture and Agri-Food Canada,Morden Research and Development Centre

[4] Advancing Wheat Technologies,Department of Agronomy

[5] Iowa State University,Department of Plant Sciences

[6] National Research Council of Canada,undefined

[7] University of Saskatchewan,undefined

[8] Plant and Food Research Canterbury Agriculture and Science Centre,undefined

[9] International Maize and Wheat Improvement Center (CIMMYT),undefined

[10] Campo Experimental Valle de México INIFAP,undefined

[11] International Maize and Wheat Improvement Center (CIMMYT),undefined

来源：

Theoretical and Applied Genetics | 2017年 / 130卷

关键词：

D O I：

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中图分类号：

学科分类号：

摘要：

引用

页码：2617 / 2635

页数：18

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