Determination of free-carrier and phonon-assisted absorptions for Si-doped GaSb thin layers

被引:0
|
作者
Faycel Saadallah
Sameh Abroug
Férederic Genty
Noureddine Yacoubi
机构
[1] IPEIN,Photothermal Laboratory of Nabeul
[2] Université Montpellier 2,IES
来源
Applied Physics A | 2013年 / 113卷
关键词
GaSb; Phonon Absorption; GaSb Layer; Photothermal Deflection; Photothermal Signal;
D O I
暂无
中图分类号
学科分类号
摘要
Photothermal deflection spectroscopy is used in order to investigate near- and sub-band gap absorption of Si-doped GaSb epilayers deposited by MBE on a semi-insulating GaAs substrate. The optical absorption spectra show an extra absorption on the transparency region below the bandgap due to free-carrier absorption. However, for energies above the gap, we notice a linear behavior of the square root of the absorption coefficient versus the heating beam energy, which is attributed to phonon-assisted absorption. From interpolation of the phonon absorption to low energies we have determined the free-carrier absorption that is found to follow the Drude law.
引用
收藏
页码:729 / 733
页数:4
相关论文
共 38 条
  • [21] Free carrier concentration gradient along the c-axis of a freestanding Si-doped GaN single crystal
    Yoon, M.
    Park, Il-Woo
    Choi, H.
    Park, Sung Soo
    Koh, Eui Kwan
    Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap, 2 (828-831):
  • [22] Free carrier concentration gradient along the c-axis of a freestanding Si-doped GaN single crystal
    Yoon, M
    Park, IW
    Choi, H
    Park, SS
    Koh, EK
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (02): : 828 - 831
  • [23] Far-infrared magnetooptical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
    Hofmann, T
    Grundmann, M
    Herzinger, CM
    Woollam, JA
    Schubert, M
    Grill, W
    PROGRESS IN SEMICONDUCTORS II- ELECTRONIC AND OPTOELECTRONIC APPLICATIONS, 2003, 744 : 277 - 282
  • [24] Modulation Depth Enhancement in Si Quantum Dot Doped SiOx Waveguide Based Free-Carrier Modulator by Adding a Ring Resonator
    Su, Sheng-Pin
    Wu, Chung-Lun
    Lin, Gong-Ru
    2014 IEEE 11TH INTERNATIONAL CONFERENCE ON GROUP IV PHOTONICS (GFP), 2014,
  • [25] Electronic degeneracy conduction in highly Si-doped Al0.6Ga0.4N layers based on the carrier compensation effect
    Kataoka, Keita
    Narita, Tetsuo
    Nagata, Kengo
    Makino, Hiroaki
    Saito, Yoshiki
    APPLIED PHYSICS LETTERS, 2020, 117 (26)
  • [26] FREE-CARRIER DENSITY DETERMINATION IN P-TYPE GAAS USING RAMAN-SCATTERING FROM COUPLED PLASMON-PHONON MODES
    WAN, K
    YOUNG, JF
    DEVINE, RLS
    MOORE, WT
    SPRINGTHORPE, AJ
    MINER, CJ
    MANDEVILLE, P
    JOURNAL OF APPLIED PHYSICS, 1988, 63 (11) : 5598 - 5600
  • [27] Far-infrared Magneto-Optical Generalized Ellipsometry determination of free-carrier parameters in semiconductor thin film structures
    Hofmann, T
    Schubert, M
    Herzinger, CM
    ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICAL, SEMICONDUCTOR, AND DATA STORAGE COMPONENTS, 2002, 4779 : 90 - 97
  • [28] PHONON-ASSISTED + PHONON-FREE RADIATIVE TRANSITIONS IN SULFUR-DOPED GAAS DIFFUSED JUNCTIONS ( ELECTROLUMINESCENCE QUANTUM EFFICIENCY 4.2-77 DEGREES K E )
    LEITE, RCC
    SARACE, JC
    YARIV, A
    APPLIED PHYSICS LETTERS, 1964, 4 (04) : 69 - +
  • [29] Acoustic phonon assisted free-carrier optical absorption in an n-type monolayer MoS2 and other transition-metal dichalcogenides
    Bhargavi, K. S.
    Patil, Sukanya
    Kubakaddi, S. S.
    JOURNAL OF APPLIED PHYSICS, 2015, 118 (04)
  • [30] OPTICAL DETERMINATION OF FREE-CARRIER CONCENTRATION IN EPITAXIAL LAYERS OF N-TYPE SILICON GROWN ON N+-SUBTRATES OR N+-SUBTRATES
    GEDDO, M
    MAGHINI, D
    STELLA, A
    COTTINI, M
    JOURNAL OF APPLIED PHYSICS, 1985, 58 (12) : 4733 - 4735