A novel device for in-situ nanomechanics of 1-D nanostructures

This paper reports the development of an in-situ nanotensilometer that enables highly reliable mechanical tensile testing on individual micro-/nanoscale structures. The device features independent measurement of force and displacement histories in the specimen with nanoNewton force and sub-nanometer displacement resolutions, respectively. Moreover, the device is well suited for in-situ testing of free-standing micro/nanostructures within a high resolution scanning electron microscope, which permits continuous high-resolution imaging of the specimen during straining. In order to conduct the nanomechanical tests the ends of the specimen are attached to the probe tips of the device using electron-beam induced deposition. The general capabilities and features of the nanotensilometer are illustrated by presenting results of nanomechanical tensile tests on electrospun polyaniline microfibers. © 2011 TMS.