A novel device for in-situ nanomechanics of 1-D nanostructures

被引：2
|
作者：
Prakash V. [1 ]
Kaul P.B. [1 ]
Park J. [1 ]
Bifano M.F.P. [1 ]
机构：
[1] Department of Mechanical and Aerospace Engineering, Case Western Reserve University, Cleveland
来源：
JOM | 2011年 / 63卷 / 9期
基金：
美国国家科学基金会;
关键词：
Polyaniline; Translation Stage; Atomic Force Micro; High Resolution Scanning Electron Microscope; Characterization Device;
D O I：
10.1007/s11837-011-0157-4
中图分类号：
学科分类号：
摘要：
This paper reports the development of an in-situ nanotensilometer that enables highly reliable mechanical tensile testing on individual micro-/nanoscale structures. The device features independent measurement of force and displacement histories in the specimen with nanoNewton force and sub-nanometer displacement resolutions, respectively. Moreover, the device is well suited for in-situ testing of free-standing micro/nanostructures within a high resolution scanning electron microscope, which permits continuous high-resolution imaging of the specimen during straining. In order to conduct the nanomechanical tests the ends of the specimen are attached to the probe tips of the device using electron-beam induced deposition. The general capabilities and features of the nanotensilometer are illustrated by presenting results of nanomechanical tensile tests on electrospun polyaniline microfibers. © 2011 TMS.
引用
收藏
页码：49 / 56
页数：7
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