Morphological transition of interfacial Ni3Sn4 grains at the Sn-3.5Ag/Ni joint

被引:0
|
作者
Jong Hoon Kim
Sang Won Jeong
Hyun Deuk Kim
Hyuck Mo Lee
机构
[1] Korea Advanced Institute of Science and Technology,Department of Materials Science and Engineering
[2] Yusung-Gu,undefined
来源
关键词
Intermetallic compound; morphological transition; Jackson’s parameter; joint strength; Sn-Ag-Ni system;
D O I
暂无
中图分类号
学科分类号
摘要
The transition in morphology of Ni3Sn4 grains that formed at the interface between liquid Sn-3.5Ag (numbers are in wt.% unless specified otherwise) solder and Ni substrate has been observed at 250–650°C. The morphological transition of Ni3Sn4 is due to the decrease of entropy of formation of the Ni3Sn4 phase and has been explained well by the change of Jackson’s parameter with temperature. According to the variation of solder joint strength with temperature, it decreased rapidly between 350°C and 450°C, where the thickness of the Ni3Sn4 intermetallic compound (IMC) layer was around 6.5 µm. However, the solder joint strength decreased slowly with an increase of soldering time without a significant drop, although the thickness of the IMC was larger than 6.5 µm. The notable drop of solder joint strength and the fracture mode transition with increase of soldering temperature appears to come from excessive lateral growth of IMC grains between 350°C and 450°C.
引用
收藏
页码:1228 / 1234
页数:6
相关论文
共 50 条
  • [31] Effect of Cu content on the mechanical reliability of Ni/Sn-3.5Ag system
    Kim J.Y.
    Sohn Y.C.
    Yu J.
    Journal of Materials Research, 2007, 22 (3) : 770 - 776
  • [32] Effect of Cu content on the mechanical reliability of Ni/Sn-3.5Ag system
    Kim, J. Y.
    Sohn, Y. C.
    Yu, Jin
    JOURNAL OF MATERIALS RESEARCH, 2007, 22 (03) : 770 - 776
  • [33] Enhanced growth of the Ni3Sn4 phase at the Sn/Ni interface subjected to strains
    Liao, Wen-Kai
    Chen, Chih-Ming
    Lin, Ming-Tzer
    Wang, Chao-Hong
    SCRIPTA MATERIALIA, 2011, 65 (08) : 691 - 694
  • [34] Interfacial reactions between Sn-3.5Ag solder and electroless Ni-P during soldering and aging
    Huang, Ming-Liang
    Bai, Dong-Mei
    Zhongguo Youse Jinshu Xuebao/Chinese Journal of Nonferrous Metals, 2010, 20 (06): : 1189 - 1194
  • [35] Interfacial reaction of Ni3Sn4 intermetallic compound in Ni/SnAg solder/Ni system under thermomigration
    Yang, Yi-Shan
    Yang, Chia-Jung
    Ouyang, Fan-Yi
    JOURNAL OF ALLOYS AND COMPOUNDS, 2016, 674 : 331 - 340
  • [36] STAPLE VARIANTS OF NI3SN4 STRUCTURE
    BHARGAVA, MK
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1973, 137 (5-6): : 441 - 441
  • [37] Characteristics of Reactive Ni3Sn4 Formation and Growth in Ni-Sn Interlayer Systems
    Lis, Adrian
    Kenel, Christoph
    Leinenbach, Christian
    METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2016, 47A (06): : 2596 - 2608
  • [38] Reflow Study of Pb-free Sn-3.5Ag Solder with Ni-Sn-P metallization
    Yang, Y.
    Balaraju, J. N.
    Chen, Z.
    2010 12TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2010, : 801 - 806
  • [39] Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solders with Ni-P under bump metallization
    He, M
    Chen, Z
    Qi, GJ
    ACTA MATERIALIA, 2004, 52 (07) : 2047 - 2056
  • [40] Characteristics of Reactive Ni3Sn4 Formation and Growth in Ni-Sn Interlayer Systems
    Adrian Lis
    Christoph Kenel
    Christian Leinenbach
    Metallurgical and Materials Transactions A, 2016, 47 : 2596 - 2608