Simultaneous Single-Event Transient (SET) Observation on LM139A Wired-and Comparator Circuit

被引:1
|
作者
Morand, S. [1 ]
Binois, C. [1 ]
de Fleurieu, H. Claret [1 ]
Carvalho, A. [1 ]
Samaras, A. [2 ]
Clatworthy, T. [3 ]
Kruckmeyer, K. [4 ]
Marin, M. [2 ]
Mangeret, R. [2 ]
Salvaterra, G. [1 ]
Staerk, D. [5 ]
机构
[1] Airbus Def & Space, F-78996Z Elancourt, France
[2] Airbus Def & Space, F-31402 Toulouse, France
[3] Airbus Def & Space, Portsmouth PO3 5PU, Hants, England
[4] Texas Instruments Inc, Santa Clara, CA 95052 USA
[5] TESAT, D-71522 Backnang, Germany
关键词
Ions; Lasers; Laser beams; Xenon; Sensitivity; Photonics; Correlation; Bipolar circuits; bipolar devices; charge sharing; comparator; electrical coupling; heavy ions; single-event transient (SET); single photon absorption (SPA); transient analysis; transient propagation; transient response; wired-AND;
D O I
10.1109/TNS.2020.3043146
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The sensitivity of the LM139A quad voltage comparator toward simultaneous single-event transient has been investigated through laser single photon absorption. The results have been supported and compared to heavy-ion tests. The analysis of sensitivity leads to the observation of two sensitive cases related to internal charge-sharing mechanism between comparator function and input line coupling effects.
引用
收藏
页码:1279 / 1285
页数:7
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