A State Recovery Design against Single-Event Transient in High-speed Phase Interpolation Clock and Data Recovery Circuit

In this thesis, we investigate optimum Radiation Hardened By Design (RHBD) in the Low Pass Filter (LPF) of the all-digital Phase Interpolation Clock and Data Recovery (PICDR) for use against Single-Event Transients (SET). PICDR is a critical circuit in the receiver of high-speed multi-channel Serial-data transceiver systems. Nevertheless, in some particular operating environment, there exist severe challenges for the PICDR. A state-recoverable PICDR is investigated regarding its SET pulse immunities. This state-recoverable PICDR is designed with 65-nm CMOS technology with the Spectre simulation tool, and in consequence it shows as a successful RHBD implementation which is immune to near 90% of the function errors caused by the SET with very low penalties.