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- [3] Single Event Transient (SET) Susceptibility of the Texas Instruments LM139 Quad Comparator under Proton Irradiation 2013 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2013,
- [5] Single-event transient (SET) characterization of a LM119 voltage comparator: An approach to SET model validation using a pulsed laser 2001 6TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, 2002, : 431 - 437
- [6] Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator 2009 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2009, : 65 - +
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