Single-event transient (SET) characterization of a LM119 voltage comparator: An approach to SET model validation using a pulsed laser

被引：0
|
作者：
Buchner, S [1 ]
McMorrow, D [1 ]
Sternberg, A [1 ]
Massengill, L [1 ]
Pease, RL [1 ]
Maher, M [1 ]
机构：
[1] USN, Res Lab, Washington, DC 20375 USA
来源：
2001 6TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS | 2002年
关键词：
D O I：
10.1109/RADECS.2001.1159318
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The characteristics of single-event transients generated in a LM119 voltage comparator with a pulsed laser have been studied under a wide variety of operating conditions. Those transients can be compared with transients obtained from circuit simulator programs to validate the model parameters used by those programs.
引用
收藏
页码：431 / 437
页数：7
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