Buckling and Wrinkling of a Thin Solid Film with Non-uniform Thickness

被引:1
|
作者
Noroozi, Masoud [1 ]
机构
[1] Islamic Azad Univ, Fac Mechatron, Karaj Branch, Karaj, Iran
来源
EUROPEAN JOURNAL OF COMPUTATIONAL MECHANICS | 2020年 / 29卷 / 2-3期
关键词
Thin solid film; structural stability; Winkler foundation; finite difference method; SANDWICH PANELS; PATTERNS;
D O I
10.13052/ejcm2642-2085.29234
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
The instability of a strip as a free-standing film and also a deposited film on a substrate is studied in this work. The non-uniform thickness of the film is assumed with a quadratic profile. The problem is categorized under the topic of structural stability and the eigenvalue problem corresponding with the ODE of the system is solved. For the free-standing film, the buckling loads and mode shapes are derived analytically through a closed-form solution. For the substrate-bonded film with a finite length, the uniaxial wrinkling of the film is investigated by using a series solution and a finite difference method and the wrinkling load and wrinkling pattern are characterized. Unlike the wrinkling of thin films with uniform thickness in which the wrinkles propagate along the entire span, it is shown that for the non-uniform film wrinkles are localized near the location with a minimum thickness along the length span; and the wrinkling accumulation is very sensitive to the thickness variations. Therefore, this work is expected to increase the insight into the localization of the wrinkles in thin film-substrate systems in engineering, industry and medical science.
引用
收藏
页码:255 / 278
页数:24
相关论文
共 50 条
  • [41] Dependence of non-uniform demagnetizing field on width of NiFe thin film AMR elements
    Department of Materials Physics, University of Science and Technology Beijing, Beijing 100083, China
    Jinshu Xuebao/Acta Metallurgica Sinica, 2007, 43 (06): : 599 - 602
  • [43] Simulation of Non-Uniform Wafer Geometry and Thin Film Residual Stress on Overlay Errors
    Veeraraghaven, Sathish
    Turner, Kevin T.
    Sinha, Jaydeep
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXV, PT 1 AND PT 2, 2011, 7971
  • [44] Dependence of non-uniform demagnetizing field on width of NiFe thin film AMR elements
    Zhang Hui
    Teng Jiao
    Yu Guanghua
    Wu Xingfang
    Zhu Fengwu
    ACTA METALLURGICA SINICA, 2007, 43 (06) : 599 - 602
  • [45] Buckling analysis of non-uniform bars with rotational and translational springs
    Li, QS
    ENGINEERING STRUCTURES, 2003, 25 (10) : 1289 - 1299
  • [46] Spatially non-uniform, isotropic misfit strain in thin films bonded on plate substrates: The relation between non-uniform film stresses and system curvatures
    Ngo, D.
    Huang, Y.
    Rosakis, A. J.
    Feng, X.
    THIN SOLID FILMS, 2006, 515 (04) : 2220 - 2229
  • [47] Analytical buckling load formulas for cylindrical shell structures with variable thickness under non-uniform external pressure
    Yang, Licai
    MATHEMATICS AND MECHANICS OF SOLIDS, 2023, 28 (02) : 446 - 463
  • [48] GBT formulation to analyze the buckling behavior of thin-walled members subjected to non-uniform bending
    Bebiano, Rui
    Silvestre, Nuno
    Camotim, Dinar
    INTERNATIONAL JOURNAL OF STRUCTURAL STABILITY AND DYNAMICS, 2007, 7 (01) : 23 - 54
  • [49] QUANTUM RINGS OF NON-UNIFORM THICKNESS IN MAGNETIC FIELD
    Rodriguez-Prada, F. A.
    Garcia, L. F.
    Mikhailov, I. D.
    7TH INTERNATIONAL CONFERENCE ON LOW DIMENSIONAL STRUCTURES AND DEVICES (LDSD 2011), 2014, 1598 : 83 - 86
  • [50] Non-uniform RKKY magnetism in thin wires
    Meilikhov, E. Z.
    Farzetdinova, R. M.
    PHYSICS LETTERS A, 2008, 372 (33) : 5484 - 5487