The instability of a strip as a free-standing film and also a deposited film on a substrate is studied in this work. The non-uniform thickness of the film is assumed with a quadratic profile. The problem is categorized under the topic of structural stability and the eigenvalue problem corresponding with the ODE of the system is solved. For the free-standing film, the buckling loads and mode shapes are derived analytically through a closed-form solution. For the substrate-bonded film with a finite length, the uniaxial wrinkling of the film is investigated by using a series solution and a finite difference method and the wrinkling load and wrinkling pattern are characterized. Unlike the wrinkling of thin films with uniform thickness in which the wrinkles propagate along the entire span, it is shown that for the non-uniform film wrinkles are localized near the location with a minimum thickness along the length span; and the wrinkling accumulation is very sensitive to the thickness variations. Therefore, this work is expected to increase the insight into the localization of the wrinkles in thin film-substrate systems in engineering, industry and medical science.
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Inst Met Superplast Problems, Ufa, RussiaNatl Res Tomsk State Univ, Tomsk, Russia
Korznikova, E. A.
Baimova, J. A.
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Inst Met Superplast Problems, Ufa, RussiaNatl Res Tomsk State Univ, Tomsk, Russia
Baimova, J. A.
Dmitriev, S. V.
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Natl Res Tomsk State Univ, Tomsk, Russia
Inst Met Superplast Problems, Ufa, RussiaNatl Res Tomsk State Univ, Tomsk, Russia
Dmitriev, S. V.
Potekaev, A. I.
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Natl Res Tomsk State Univ, Tomsk, Russia
Tomsk State Univ, VD Kuznetsov Siberian Phys Tech Inst, Tomsk 634050, RussiaNatl Res Tomsk State Univ, Tomsk, Russia
Potekaev, A. I.
Melnikova, E. A.
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Natl Res Tomsk State Univ, Tomsk, RussiaNatl Res Tomsk State Univ, Tomsk, Russia
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Korea Inst Machinery & Mat, Nanomech Syst Res Div, Taejon 305343, South KoreaKorea Inst Machinery & Mat, Nanomech Syst Res Div, Taejon 305343, South Korea