Study of dark counts in Geiger mode In0.53Ga0.47As/In0.52Al0.48AsSACM APDs

被引：0
|
作者：
Karve, G [1 ]
Wang, S [1 ]
Ma, F [1 ]
Li, X [1 ]
Campbell, JC [1 ]
Ispasoiu, R [1 ]
Bethune, DS [1 ]
Risk, WP [1 ]
机构：
[1] Univ Texas, Microelect Res Ctr, Dept Elect & Comp Engn, Austin, TX 78712 USA
来源：
2004 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 | 2004年
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D O I：
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
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页码：72 / 73
页数：2
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