reflection high-energy electron diffraction (RHEED);
x-ray scattering;
diffraction;
and reflection;
surface relaxation and reconstruction;
surface structure;
morphology;
roughness;
and topography;
growth;
molecular beam epitaxy;
D O I:
10.1016/S0039-6028(03)00361-3
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Ferroelectric BaTiO3 thin films with a thickness of 10 monolayers (ML) were epitaxially grown on SrTiO3(001) substrates by very slow deposition using molecular beam epitaxy (MBE). The investigations were carried out by two growth methods: (i) codeposition and (ii) alternate deposition of the metal elements in an oxygen atmosphere. In situ observation of reflection high-energy electron diffraction confirmed that an epitaxial cube-on-cube structure was prepared. After the deposition, X-ray diffraction measurements were carried out. The 10-ML-thick BaTiO3 films were highly c-axis oriented single crystals with good film quality. (C) 2003 Elsevier Science B.V. All rights reserved.
机构:
Southern Fed Univ, Fac Phys, Rostov Na Donu 344090, RussiaSouthern Fed Univ, Fac Phys, Rostov Na Donu 344090, Russia
Yuzyuk, Yu. I.
Sakhovoy, R. A.
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Southern Fed Univ, Fac Phys, Rostov Na Donu 344090, RussiaSouthern Fed Univ, Fac Phys, Rostov Na Donu 344090, Russia
Sakhovoy, R. A.
Maslova, O. A.
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Southern Fed Univ, Fac Phys, Rostov Na Donu 344090, RussiaSouthern Fed Univ, Fac Phys, Rostov Na Donu 344090, Russia
Maslova, O. A.
Shirokov, V. B.
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Southern Fed Univ, Fac Phys, Rostov Na Donu 344090, Russia
Southern Sci Ctr RAS, Rostov Na Donu 344006, RussiaSouthern Fed Univ, Fac Phys, Rostov Na Donu 344090, Russia
Shirokov, V. B.
Zakharchenko, I. N.
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Southern Fed Univ, Fac Phys, Rostov Na Donu 344090, RussiaSouthern Fed Univ, Fac Phys, Rostov Na Donu 344090, Russia
Zakharchenko, I. N.
Belhadi, J.
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机构:
Univ Picardie Jules Verne, Lab Phys Matiere Condensee, F-80039 Amiens, FranceSouthern Fed Univ, Fac Phys, Rostov Na Donu 344090, Russia
Belhadi, J.
El Marssi, M.
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机构:
Univ Picardie Jules Verne, Lab Phys Matiere Condensee, F-80039 Amiens, FranceSouthern Fed Univ, Fac Phys, Rostov Na Donu 344090, Russia
机构:
Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USAForschungszentrum Julich, Inst Schichten & Grenzflachen ISGI IT, D-52425 Julich, Germany
机构:
Kyung Hee Univ, Dept Appl Phys, Yongin 17104, South Korea
Kyung Hee Univ, Inst Nat Sci, Yongin 17104, South Korea
Kyung Hee Univ, Integrated Educ Program Frontier Mat BK21 Four, Yongin 17104, South KoreaKorea Univ Technol & Educ, Sch Liberal Arts, Cheonan 31253, South Korea