X-ray resonant magnetic reflectivity from Fe/Ce multilayers

被引：0
|
作者：
Jaouen, N
Tonnerre, JM
Raoux, D
Müenzenberg, M
Felsch, W
Rogalev, A
Brookes, N
Dürr, H
Van der Laan, G
机构：
[1] ESRF, F-38043 Grenoble, France
[2] CNRS, Lab Cristallog, F-38042 Grenoble, France
[3] Univ Gottingen, I Phys Inst, D-37073 Gottingen, Germany
[4] Daresbury Lab, Warrington WA4 4AD, Cheshire, England
来源：
ACTA PHYSICA POLONICA B | 2003年 / 34卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We report on X-ray resonant magnetic reflectivity (XRMR) at the Ce L-2 and M-4,M-5 edges in an ex-situ grown Fe/Ce multilayer. We show that the measurement of the magnetic contribution to the intensities reflected at low angles allows us to investigate the profile of the Ce 5d and 4f magnetization. The calculated XRMR signals indicate that the Ce moments have a non-collinear structure.
引用
收藏
页码：1403 / 1406
页数：4
相关论文
共 50 条
  • [31] X-ray resonant magnetic scattering: Application to thin films and multilayers
    Raoux, D
    Jaouen, N
    Tonnerre, JM
    Bontempi, E
    ACTA PHYSICA POLONICA A, 2000, 98 (05) : 483 - 494
  • [32] X-ray magnetic circular dichroism of Gd/Fe multilayers
    Kato, T
    Fujiwara, Y
    Yano, K
    Tsunashima, S
    Iwata, S
    Masuda, M
    IEEE TRANSACTIONS ON MAGNETICS, 2000, 36 (05) : 2909 - 2911
  • [33] Interfacial magnetism by resonant X-ray reflectivity
    Grenier, Stephane
    Tonnerre, Jean-Marc
    Jal, Emmanuelle
    Elzo, Marta
    Jaouen, Nicolas
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2011, 67 : C60 - C61
  • [34] X-ray resonant magnetic reflectivity of stratified magnetic structures: Eigenwave formalism and application to a W/Fe/W trilayer
    Elzo, M.
    Jal, E.
    Bunau, O.
    Grenier, S.
    Joly, Y.
    Ramos, A. Y.
    Tolentino, H. C. N.
    Tonnerre, J. M.
    Jaouen, N.
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2012, 324 (02) : 105 - 112
  • [35] Characterization of multilayers by Fourier analysis of x-ray reflectivity
    Voorma, HJ
    Louis, E
    Koster, NB
    Bijkerk, F
    Spiller, E
    JOURNAL OF APPLIED PHYSICS, 1997, 81 (09) : 6112 - 6119
  • [36] The microstructure and X-ray reflectivity of Mo/Si multilayers
    Andreev, SS
    Gaponov, SV
    Gusev, SA
    Haidl, MN
    Kluenkov, EB
    Prokhorov, KA
    Polushkin, NI
    Sadova, EN
    Salashchenko, NN
    Suslov, LA
    Zuev, SY
    THIN SOLID FILMS, 2002, 415 (1-2) : 123 - 132
  • [37] Probing magnetic ordering in multilayers using soft x-ray resonant magnetic scattering
    Marrows, CH
    Steadman, P
    Hampson, AC
    Michez, LA
    Hickey, BJ
    Telling, ND
    Arena, DA
    Dvorak, J
    Langridge, S
    PHYSICAL REVIEW B, 2005, 72 (02)
  • [38] Measuring magnetic hysteresis curves with polarized soft X-ray resonant reflectivity
    Fan, Raymond
    Kiranjot
    Aboljadayel, Razan O. M.
    Alsaeed, Kalel
    Bencok, Peter
    Burn, David M.
    Hindmarch, Aidan T.
    Steadman, Paul
    JOURNAL OF SYNCHROTRON RADIATION, 2024, 31 : 493 - 507
  • [39] Heusler films and multilayers: X-ray resonant magnetic scattering and polarized neutron reflectivity studies on the relation between structure and magnetism
    Bergmann, Andre
    Grabis, Johannes
    Vadala, Miriana
    Nefedov, Alexei
    Westerholt, Kurt
    Zabel, Hartmut
    INTERNATIONAL JOURNAL OF MATERIALS RESEARCH, 2008, 99 (05) : 461 - 470
  • [40] Rotation of a Gd moment vector in an Fe/FeGd/Fe trilayer observed by hysteresis measurements of the resonant X-ray magnetic reflectivity
    Kodama, Kenji
    Hosoito, Nobuyoshi
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (6A): : 3402 - 3405
12345