X-ray resonant magnetic reflectivity from Fe/Ce multilayers

被引：0
|
作者：
Jaouen, N
Tonnerre, JM
Raoux, D
Müenzenberg, M
Felsch, W
Rogalev, A
Brookes, N
Dürr, H
Van der Laan, G
机构：
[1] ESRF, F-38043 Grenoble, France
[2] CNRS, Lab Cristallog, F-38042 Grenoble, France
[3] Univ Gottingen, I Phys Inst, D-37073 Gottingen, Germany
[4] Daresbury Lab, Warrington WA4 4AD, Cheshire, England
来源：
ACTA PHYSICA POLONICA B | 2003年 / 34卷 / 02期
关键词：
D O I：
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We report on X-ray resonant magnetic reflectivity (XRMR) at the Ce L-2 and M-4,M-5 edges in an ex-situ grown Fe/Ce multilayer. We show that the measurement of the magnetic contribution to the intensities reflected at low angles allows us to investigate the profile of the Ce 5d and 4f magnetization. The calculated XRMR signals indicate that the Ce moments have a non-collinear structure.
引用
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页码：1403 / 1406
页数：4
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