Power supply di/dt measurement using on-chip di/dt detector circuit

被引：6
|
作者：
Nakura, T [1 ]
Ikeda, M [1 ]
Asada, K [1 ]
机构：
[1] Univ Tokyo, Dept Elect Engn, VDEC, Tokyo 1138656, Japan
来源：
2004 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS | 2004年
关键词：
D O I：
10.1109/VLSIC.2004.1346519
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper demonstrates an on-chip di/dt detector circuit. The di/dt detector circuit consists of a spiral inductor under the power supply line which induces a di/dt proportional voltage, and an amplifier which amplifies and outputs the value. The measurement results show that the di/dt detector output and the voltage difference between a resistor have good agreement. The di/dt detector also measures the de-coupling capacitor effects for the di/dt reduction.
引用
收藏
页码：106 / 109
页数：4
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